Agilent Technologies 35670A Manuale di Servizio

Agilent 35670ADynamic Signal Analyzer Versatile two- or four-channel high-performance FFT-based spectrum/network analyzer 122 μHz to 102.4 kHz 16-bit

10ANSI S1.11-1986All octave filters comply with filter shape standards ANSI S1.11-1986 (Order 3, type 1-D), DIN 45651, and IEC 225-1966. An 80 dB dyna

11Swept-Sine Measurements (Option 1D2)Logarithmic sweepTest devices over more than six decades of frequency range using logarithmic sweep. In this mod

12Realize the advantages of using your instrument with a com put er without sacrificing portability. Agilent Instrument BASIC provides the power of a

13Curve fi t provides an exact math e mat i cal model of your circuit or device.Add Two Channels (Option AY6)51.2 kHz frequency range on one and two c

14Arbitrary Waveform Source (Option 1D4)Store up to eight arbitrary wave formsTest your products using real-world signals. Measure a signal in either

15Agilent 35670A Ordering InformationAgilent 35670A Dynamic Signal Analyzer standard con fi g u ra tion1.4 Mbyte, 3.5-in. flexible disk drive12+ Mbyte

16Summary of Features on Standard InstrumentInstrument modesFFT analysis Histogram/timeCorrelation analysis Time captureMeasurementFrequency domainF

17Input channelsManual rangeAnti-alias filters On/OffAC or DC couplingUp-only auto rangeUp/down auto range LED half range and overload indicatorsFloat

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2Agilent 35670A Dynamic Signal AnalyzerInput channels• 16-bit ADC• ±0.15 dB spectrum amplitude accuracy • ±0.04 dB, ±0.5 degrees channel match (full s

3Source types• Random noise• Burst random noise• Periodic chirp• Burst chirp• Pink noise• Fixed Sine• Arbitrary waveform source (Option 1D4)• Swept-si

4Laboratory-quality mea sure ments in the fi eldObtain all of the performance of your bench-top analyzer in a portable instrument.Ease-of-usePortabi

5Time domainUse your spectrum analyzer as a low-frequency os cil lo scope or view signals in the time and frequency domains simultaneously. (Note:

6Frequency Response Measurements Four channels (Option AY6)Test up to three devices si mul taneous-ly with a four-channel 35670A. Channel one is the c

7Time CaptureAn interval of time-capture data has been selected for analysis in the octave mode.Capture transient events or time histories for complet

8Using Measurement Results Computed Order Tracking (Option 1D0)The slice marker feature is used to select and display an order or suborder from an ord

9Order mapUse order maps for an overview of vibration data versus RPM or time. Display the amplitude profile of individual orders and suborders using