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www.agilent.com/find/dcax
Applications:
Optimizing Manufacturing Test Cost
Common transceiver types and manufacturing flows
The number of communications standards and transceiver types has pro-
liferated during the last decade creating more complexity for the typical
manufacturing test facility. Mass market and other high volume transceiv-
ers typically have fewer tests and less temperature cycling. More complex
transceivers at higher data rates have more extensive tuning, temperature
cycling and challenges to meet high desired yields.
The ultimate goal of Agilent’s approach is to provide a sufficiently
accurate answer, very quickly, which is enabled by these recently intro-
duced capabilities:
• DCA with parallel characterization of multiple devices, or
characterization of parallel optics, Improved autoscale performance,
eye tuning, rapid eye, faster eye mask testing
• Multi-channel BERTs for characterizing multi-channel devices and
multi-channel standards (4 x 25 G)
• Great improvements in cost of test are achieved by testing multiple
transceivers in parallel, either several single channel transmitters at
once or several channels on a multi-channel transmitter
• Multi-port optical attenuator with up to four separate attenuators that
are settable in parallel and provide fast settling times, a significant
improvement in both multi-device and multi-lane testing
• Newly designed attenuation devices that ensure high modal fidelity in
multimode fiber based transceiver testing, a contribution to narrower
test margins and thus better yield
Implementing these innovations in your production line can improve by 2X
to 10X the number of units tested per station per year, and result in a 2X
to 5X improvement in the cost-of-test per transmitter.
Characteristics for common optical communications standards
Typical manufacturing flow for simpler and less expensive devices.
Typical manufacturing flow for more complex devices.
Introduction
Manufacturers of optical transceivers are faced with increasing challenges
to their businesses, particularly how to reduce product cost. Pressures to
reduce cost as data rates rise means manufacturing engineering manag-
ers and their engineers must be more creative in how to reduce costs be-
fore their competitors do. Traditional methods of eliminating tests or trying
to make tests run faster may not be feasible, may not yield the intended
benefit or may provide results that don’t agree well with their customer’s
measurements. The use of parallel testing promises huge improvements,
but more innovation is needed. Read below, how Agilent helps to optimize
the manufacturing processes of optical components.
• Fibre Channel to 4X
• SONET/SDH to OC-48
• Gigabit Ethernet
• Wireless CPRI
• Passive optical network
SFP, SFF and PON 0.155 to 6.25 1 Figure 1
• Fibre channel to 16X
• 10 G and 40 G Ethernet
SFP+ and XFP 1 to 14 1 Figure 1 or Figure 2
• 10 Gb, 40 Gb and 100 Gb Ethernet
• 32G Fibre Channel
• SONET OC-192
QSFP and CFP 10 to 29 4, 8, 10, 12 Figure 2
Standards Package types
Channel rates,
Gb/s
Optical
transmitters
Manufacturing
test flow
Assembly Tuning Final test
Fail
4 Gb
Iterative Re-work and
re-test for less
demanding
applications
Assembly Tuning Final test
Temperature
cycles
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