Agilent Technologies 24A Guida Utente

User’s GuideAgilent Technologies8719ET/20ET/22ET8719ES/20ES/22ESNetwork AnalyzersPart Number 08720-90392Printed in USAJuly 2000Supersedes May 2000© Co

Contents-xContentsTo Use External Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-13To U

1-87Making MeasurementsUsing Ripple Limits to Test a Device7. After you have added all of the new frequency bands, return to the ripple test menu bypr

1-88Making MeasurementsUsing Ripple Limits to Test a DeviceFigure 1-67 Filter Passband with Ripple Test ActivatedAs the analyzer measures the ripple,

1-89Making MeasurementsUsing Ripple Limits to Test a Deviceripple value above the lower ripple limit. The ripple that exceeds the maximum ripplevalue

1-90Making MeasurementsUsing Ripple Limits to Test a Deviceand ripple test off status.When the Absolute and Margin choices are selected, the frequency

1-91Making MeasurementsUsing Ripple Limits to Test a DeviceViewing the Ripple Value in Margin FormatWhen is selected, the margin by which the ripple v

1-92Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterUsing Bandwidth Limits to Test a Bandpass FilterThe bandwidth testing mode can

1-93Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterFigure 1-72 Connections for a Bandpass Filter Example Measurement2. Press and

1-94Making MeasurementsUsing Bandwidth Limits to Test a Bandpass Filter3. Substitute a thru for the device and perform a response calibration by press

1-95Making MeasurementsUsing Bandwidth Limits to Test a Bandpass Filterperformed. For example, BW1: indicates that the bandwidth test is being run onc

1-96Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterFigure 1-75 Bandwidth Markers Placed 40 dB Below the Bandpass PeakDisplaying th

ContentsContents-xiModify the Cal Kit Thru Definition . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-46Minimizi

1-97Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterFigure 1-76 Filter Pass Band with Bandwidth Value Displayed

1-98Making MeasurementsUsing Test SequencingUsing Test SequencingTest sequencing allows you to automate repetitive tasks. As you make a measurement, t

1-99Making MeasurementsUsing Test SequencingFigure 1-77 Test Sequencing Help Instructions2. To select a sequence position in which to store your seque

1-100Making MeasurementsUsing Test SequencingThe previous keystrokes will create a displayed list as shown:Start of SequenceRECALL PRST STATETrans: FW

1-101Making MeasurementsUsing Test Sequencing3. To move the cursor to the command that you wish to delete, press: or• If you wish to scroll through th

1-102Making MeasurementsUsing Test SequencingThe following list is the commands entered in "Creating a Sequence" on page 1-98.Notice that fo

1-103Making MeasurementsUsing Test SequencingChanging the Sequence TitleIf you are storing sequences on a disk, you should replace the default titles

1-104Making MeasurementsUsing Test SequencingStoring a Sequence on a Disk1. To format a disk, refer to Chapter 4 , “Printing, Plotting, and Saving Mea

1-105Making MeasurementsUsing Test SequencingPrinting a Sequence1. Configure a compatible printer to the analyzer. (Refer to the “Options and Accessori

1-106Making MeasurementsUsing Test SequencingCommands That Require a Clean SweepMany front panel commands disrupt the sweep in progress, for example,

Contents-xiiContentsSWR Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-107Making MeasurementsUsing Test SequencingNOTE Presetting the instrument does not run the Auto Sequence automatically.Gosub Sequence CommandThe so

1-108Making MeasurementsUsing Test SequencingThe TESTSET I/O bits are set using the and keysunder the keys. The values of the outputs (pins 11, 22, an

1-109Making MeasurementsUsing Test SequencingElectrical specifications for TTL low:• volts(L) ≤ 0.4 volts (V)• current = 0.2 milliamps (mA)Figure 1-78

1-110Making MeasurementsUsing Test SequencingChanging the switch state back to the standard mode requires a 7 to be entered in the“TESTSET I/O FWD.”Pi

1-111Making MeasurementsUsing Test SequencingTTL Out Menu The softkey provides access to the TTL out menu. This menuallows you to choose between the f

1-112Making MeasurementsUsing Test SequencingDecision Making FunctionsDecision making functions jump to a softkey location, not to a specific sequencet

1-113Making MeasurementsUsing Test Sequencing to Test a DeviceUsing Test Sequencing to Test a DeviceTest sequencing allows you to automate repetitive

1-114Making MeasurementsUsing Test Sequencing to Test a DeviceThe following sequences will be created:SEQUENCE SEQ1Start of SequenceCENTER 134 M/uSPA

1-115Making MeasurementsUsing Test Sequencing to Test a DeviceTo create a second sequence that will perform a desired measurement function,decrement t

1-116Making MeasurementsUsing Test Sequencing to Test a DeviceThis will create the following displayed lists:Start of SequenceLOOP COUNTER7x1INTERNAL

ContentsContents-xiiiFrequency Offset Operation (Option 089) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-84Difference

1-117Making MeasurementsUsing Test Sequencing to Test a Device• The data file names generated by this sequence will be:DT00007.D1throughDT000001.D1• Th

1-118Making MeasurementsUsing Test Sequencing to Test a Device2. To create a sequence that stores the measurement data for a device that has passed th

2-12 Making Mixer Measurements(Option 089 Only)

2-2Making Mixer Measurements (Option 089 Only)Using This ChapterUsing This ChapterThis chapter contains the following:• Information on mixer measureme

2-3Making Mixer Measurements (Option 089 Only)Mixer Measurement CapabilitiesMixer Measurement CapabilitiesThe analyzer is capable of measuring the fol

2-4Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsMeasurement ConsiderationsIn mixer transmission measurements, you have RF and

2-5Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsFigure 2-2 Conversion Loss versus Output Frequency Without Attenuators atMixer

2-6Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsEliminating Unwanted Mixing and Leakage SignalsBy placing filters between the m

2-7Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsFigure 2-5 Example of Conversion Loss versus Output Frequency With CorrectIF S

2-8Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsFigure 2-6 Examples of Up Converters and Down ConvertersIn standard mixer meas

1-11 Making Measurements

2-9Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsFigure 2-7 Down Converter Port Connections• In an up converter measurement whe

2-10Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsFrequency Offset Mode OperationThis mode of operation allows you to offset th

2-11Making Mixer Measurements (Option 089 Only)Measurement ConsiderationsThe following steps can be performed to observe this offset in power:1. To se

2-12Making Mixer Measurements (Option 089 Only)Measurement Considerations5. Measure the output power in the R channel by pressing:Observe the 13 to 16

2-13Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModeConversion Loss Using the Frequency Offset ModeConversio

2-14Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModeFigure 2-11 Connections for R Channel and Source Calibra

2-15Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModeNOTE The Agilent E4418B and Agilent E4419B power meters

2-16Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModeThe LO menu is used to set only the LO CW frequency. All

2-17Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModePerforming a Power Meter Calibration Over the RF Range1.

2-18Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModePerforming the R-Channel Measurement1. Connect the equip

1-2Making MeasurementsUsing This ChapterUsing This ChapterThis chapter contains the following example procedures for making measurements. Mixerand tim

2-19Making Mixer Measurements (Option 089 Only)Conversion Loss Using the Frequency Offset ModeFigure 2-16 Conversion Loss Example MeasurementIn this m

2-20Making Mixer Measurements (Option 089 Only)High Dynamic Range Swept RF/IF Conversion LossHigh Dynamic Range Swept RF/IF Conversion LossThe frequen

2-21Making Mixer Measurements (Option 089 Only)High Dynamic Range Swept RF/IF Conversion LossFigure 2-17 Connections for Power Meter Calibration3. Sel

2-22Making Mixer Measurements (Option 089 Only)High Dynamic Range Swept RF/IF Conversion LossNOTE Because power meter calibration requires a longer sw

2-23Making Mixer Measurements (Option 089 Only)High Dynamic Range Swept RF/IF Conversion LossUsing the Mixer Measurement DiagramWhile the analyzer is

2-24Making Mixer Measurements (Option 089 Only)High Dynamic Range Swept RF/IF Conversion Loss2. Make the connections shown in Figure 2-20.3. Set the L

2-25Making Mixer Measurements (Option 089 Only)High Dynamic Range Swept RF/IF Conversion Loss4. Set the analyzers LO frequency to match the frequency

2-26Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsFixed IF Mixer MeasurementsA fixed IF can be produced by using both a swept R

2-27Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsNOTE You may have to consult the user's guide of the external source be

2-28Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsPutting the Analyzer into Tuned Receiver ModeSetting Up a Frequency List Swe

1-3Making MeasurementsMore Instrument Functions Not Described in This GuideMore Instrument Functions Not Described in This GuideTo learn about instrum

2-29Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsInitializing a Loop Counter Value to 26Addressing and Configuring the Two Sou

2-30Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsTUNED RECEIVEREDIT LISTADDCW FREQ100M/uNUMBER OF POINTS26x1DONEDONELIST FREQ

2-31Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsSequence 2 SetupThe following sequence makes a series of measurements until

2-32Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsPress and the analyzer willdisplay the following sequence commands:SEQUENCE

2-33Making Mixer Measurements (Option 089 Only)Fixed IF Mixer MeasurementsWhen the sequences are finished you should have a result as shown in Figure 2

2-34Making Mixer Measurements (Option 089 Only)Phase or Group Delay MeasurementsPhase or Group Delay MeasurementsFor information on group delay princi

2-35Making Mixer Measurements (Option 089 Only)Phase or Group Delay Measurements1. Set the LO source to the desired CW frequency of 1000 MHz and power

2-36Making Mixer Measurements (Option 089 Only)Phase or Group Delay MeasurementsFigure 2-25 Connections for a Group Delay Measurement6. To select the

2-37Making Mixer Measurements (Option 089 Only)Phase or Group Delay Measurements10.Replace the "calibration" mixer with the device under tes

2-38Making Mixer Measurements (Option 089 Only)Amplitude and Phase TrackingAmplitude and Phase TrackingThe match between mixers is defined as the absol

1-4Making MeasurementsMaking a Basic MeasurementMaking a Basic MeasurementThere are five basic steps when you are making a measurement.1. Connect the d

2-39Making Mixer Measurements (Option 089 Only)Conversion Compression Using the Frequency Offset ModeConversion Compression Using the Frequency Offset

2-40Making Mixer Measurements (Option 089 Only)Conversion Compression Using the Frequency Offset Mode4. To set the analyzer to the desired power sweep

2-41Making Mixer Measurements (Option 089 Only)Conversion Compression Using the Frequency Offset Mode8. Make the connections as shown in Figure 2-30.C

2-42Making Mixer Measurements (Option 089 Only)Conversion Compression Using the Frequency Offset ModeThe measurements setup diagram is shown in Figure

2-43Making Mixer Measurements (Option 089 Only)Conversion Compression Using the Frequency Offset ModeFigure 2-32 Example Swept Power Conversion Compre

2-44Making Mixer Measurements (Option 089 Only)Isolation Example MeasurementsIsolation Example MeasurementsIsolation is the measure of signal leakage

2-45Making Mixer Measurements (Option 089 Only)Isolation Example MeasurementsFigure 2-34 Connections for a Response Calibration5. Perform a response c

2-46Making Mixer Measurements (Option 089 Only)Isolation Example Measurements7. To adjust the display scale, press:The measurement results show the mi

2-47Making Mixer Measurements (Option 089 Only)Isolation Example Measurements4. To select a ratio B/R measurement, press:NOTE Isolation is dependent o

2-48Making Mixer Measurements (Option 089 Only)Isolation Example Measurements8. Connect the external LO source to the mixer's LO port.9. The meas

1-5Making MeasurementsMaking a Basic MeasurementSetting the Frequency RangeTo set the center frequency to 134 MHz, press:To set the span to 30 MHz, pr

2-49Making Mixer Measurements (Option 089 Only)Isolation Example MeasurementsSWR / Return LossReflection coefficient (Γ) is defined as the ratio between

3-13 Making Time Domain Measurements

3-2Making Time Domain MeasurementsUsing This ChapterUsing This ChapterThis chapter contains the following:• An introduction to time domain measurement

3-3Making Time Domain MeasurementsIntroduction to Time Domain MeasurementsIntroduction to Time Domain MeasurementsThe analyzers with Option 010 allow

3-4Making Time Domain MeasurementsIntroduction to Time Domain MeasurementsFigure 3-1 Device Frequency Domain and Time Domain Reflection ResponsesThe ti

3-5Making Time Domain MeasurementsMaking Transmission Response MeasurementsMaking Transmission Response MeasurementsIn this example measurement there

3-6Making Time Domain MeasurementsMaking Transmission Response Measurements5. To transform the data from the frequency domain to the time domain and s

3-7Making Time Domain MeasurementsMaking Transmission Response Measurements11.To activate the gating function to remove any unwanted responses, press:

3-8Making Time Domain MeasurementsMaking Transmission Response MeasurementsFigure 3-5 Gate Shape• To see the effect of the gating in the frequency dom

3-9Making Time Domain MeasurementsMaking Reflection Response MeasurementsMaking Reflection Response MeasurementsThe time domain response of a reflection

1-6Making MeasurementsMaking a Basic MeasurementStep 5. Output the measurement results.To create a printed copy of the measurement results, press: (or

3-10Making Time Domain MeasurementsMaking Reflection Response MeasurementsFigure 3-8 Device Response in the Frequency Domain5. To transform the data fr

3-11Making Time Domain MeasurementsMaking Reflection Response Measurements8. To position the marker on the reflection of interest, press: and turn the f

3-12Making Time Domain MeasurementsTime Domain Bandpass ModeTime Domain Bandpass ModeThis mode is called bandpass because it works with band-limited d

3-13Making Time Domain MeasurementsTime Domain Bandpass ModeFigure 3-10 A Reflection Measurement of Two CablesThe ripples in reflection coefficient versu

3-14Making Time Domain MeasurementsTime Domain Bandpass ModeTransmission Measurements Using Bandpass ModeThe bandpass mode can also transform transmis

3-15Making Time Domain MeasurementsTime Domain Low Pass ModeTime Domain Low Pass ModeThis mode is used to simulate a traditional time domain reflectome

3-16Making Time Domain MeasurementsTime Domain Low Pass ModeMinimum Allowable Stop FrequenciesThe lowest analyzer measurement frequency is 50 MHz, the

3-17Making Time Domain MeasurementsTime Domain Low Pass ModeInterpreting the Low Pass Response Vertical AxisThe vertical axis depends on the chosen fo

3-18Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-13 Simulated Low Pass Step and Impulse Response Waveforms(Real Format)Figure 3-14

3-19Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-14 Low Pass Step Measurements of Common Cable Faults(Real Format)Transmission Mea

iiNoticeThe information contained in this document is subject to change without notice.Agilent Technologies makes no warranty of any kind with regard

1-7Making MeasurementsMeasuring Magnitude and Insertion Phase ResponseMeasuring Magnitude and Insertion Phase ResponseThis measurement example shows y

3-20Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-15 Time Domain Low Pass Measurement of an Amplifier Small SignalTransient Response

3-21Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-16 Transmission Measurements Using Low Pass Impulse Mode

3-22Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainTransforming CW Time Measurements into the FrequencyDoma

3-23Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainInterpreting the Forward Transform Horizontal AxisIn a f

3-24Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainFigure 3-19. Separating the Amplitude and Phase Componen

3-25Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainFigure 3-20 Range of a Forward Transform MeasurementTo i

3-26Making Time Domain MeasurementsMaskingMaskingMasking occurs when a discontinuity (fault) closest to the reference plane affects theresponse of eac

3-27Making Time Domain MeasurementsWindowingWindowingThe analyzer provides a windowing feature that makes time domain measurements moreuseful for isol

3-28Making Time Domain MeasurementsWindowingChoose one of the three window shapes listed or use the knob to select any windowingpulse width (or rise t

3-29Making Time Domain MeasurementsWindowingFigure 3-23 The Effects of Windowing on the Time Domain Responses of a ShortCircuit (Real Format)

1-8Making MeasurementsMeasuring Magnitude and Insertion Phase ResponseIf the channels are coupled (the default condition), this calibration is valid f

3-30Making Time Domain MeasurementsRangeRangeIn the time domain, range is defined as the length in time that a measurement can bemade without encounter

3-31Making Time Domain MeasurementsRangeIn this example, the range is 100 ns, or 30 meters electrical length. To prevent the timedomain responses from

3-32Making Time Domain MeasurementsResolutionResolutionTwo different resolution terms are used in the time domain:• response resolution• range resolut

3-33Making Time Domain MeasurementsResolutiondiscontinuity shadowing the response of a smaller discontinuity, all act to degrade theeffective response

3-34Making Time Domain MeasurementsResolutionRange ResolutionTime domain range resolution is defined as the ability to locate a single response in time

3-35Making Time Domain MeasurementsGatingGatingGating provides the flexibility of selectively removing time domain responses. Theremaining time domain

3-36Making Time Domain MeasurementsGatingSetting the GateThink of a gate as a bandpass filter in the time domain (see Figure 3-27). When the gate ison,

4-14 Printing, Plotting, and SavingMeasurement Results

4-2Printing, Plotting, and Saving Measurement ResultsUsing This ChapterUsing This ChapterThis chapter contains instructions for the following tasks:•

4-3Printing, Plotting, and Saving Measurement ResultsPrinting or Plotting Your Measurement ResultsPrinting or Plotting Your Measurement ResultsYou can

1-9Making MeasurementsMeasuring Magnitude and Insertion Phase ResponseFigure 1-4 Example Insertion Phase Response MeasurementThe phase response shown

4-4Printing, Plotting, and Saving Measurement ResultsConfiguring a Print FunctionConfiguring a Print FunctionAll copy configuration settings are stored i

4-5Printing, Plotting, and Saving Measurement ResultsConfiguring a Print Function3. Select one of the following printer interfaces:• Choose if your pr

4-6Printing, Plotting, and Saving Measurement ResultsDefining a Print FunctionDefining a Print FunctionNOTE The print definition is set to default values

4-7Printing, Plotting, and Saving Measurement ResultsDefining a Print FunctionTo Reset the Printing Parameters to Default Values1. Press .Table 4-1 Def

4-8Printing, Plotting, and Saving Measurement ResultsPrinting One Measurement Per PagePrinting One Measurement Per Page1. Configure and define the print

4-9Printing, Plotting, and Saving Measurement ResultsPrinting Multiple Measurements Per PagePrinting Multiple Measurements Per Page1. Configure and defi

4-10Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot FunctionConfiguring a Plot FunctionAll copy configuration settings are stored in

4-11Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot FunctionInformation regarding a printer compatibility guide (an up-to-date lis

4-12Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot FunctionIf You Are Plotting to a Pen Plotter1. Press and then until appears.

4-13Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot FunctionIf You Are Plotting Measurement Results to a Disk DriveThe plot files t

1-10Making MeasurementsUsing Display FunctionsUsing Display FunctionsThis section provides the necessary information for using the display functions.

4-14Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot FunctionFigure 4-4 Automatic File Naming Convention for LIF FormatTo Output th

4-15Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionDefining a Plot Function1. Press .Choosing Display Elements• Choose which

4-16Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionNOTE The peripheral ignores when you are plotting to aquadrant.Selecting

4-17Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionSelecting Line Types• Press and select each plot element line type that

4-18Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionFigure 4-7 Locations of P1 and P2 in ModeChoosing Plot Speed• Press unt

4-19Printing, Plotting, and Saving Measurement ResultsPlotting One Measurement Per Page Using a Pen PlotterPlotting One Measurement Per Page Using a P

4-20Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page Using a Pen PlotterPlotting Multiple Measurements Per Pa

4-21Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page Using a Pen PlotterIf You Are Plotting to an HPGL Compat

4-22Printing, Plotting, and Saving Measurement ResultsTo View Plot Files on a PCTo View Plot Files on a PCPlot files can be viewed and manipulated on a

4-23Printing, Plotting, and Saving Measurement ResultsTo View Plot Files on a PCUsing Ami ProTo view plot files in Ami Pro, perform the following steps

1-11Making MeasurementsUsing Display FunctionsTitling the Active Channel Display1. Press to access the title menu.2. Press and enter the title you w

4-24Printing, Plotting, and Saving Measurement ResultsOutputting Plot Files from a PC to a PlotterConverting HPGL Files for Use with Other PC Applicat

4-25Printing, Plotting, and Saving Measurement ResultsOutputting Plot Files from a PC to an HPGL Compatible PrinterOutputting Plot Files from a PC to

4-26Printing, Plotting, and Saving Measurement ResultsOutputting Single Page Plots Using a PrinterStep 2. Store the exit HPGL mode and form feed seque

4-27Printing, Plotting, and Saving Measurement ResultsOutputting Multiple Plots to a Single Page Using a PrinterOutputting Multiple Plots to a Single

4-28Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from DiskPlotting Multiple Measurements Per Page from Di

4-29Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from DiskTo Plot Multiple Measurements on a Full PageYou

4-30Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from DiskFigure 4-10 Plotting Two Files on the Same Page

4-31Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from Disk5. Make the next measurement that you want to s

4-32Printing, Plotting, and Saving Measurement ResultsTitling the Displayed MeasurementTitling the Displayed Measurement1. Press to access the title

4-33Printing, Plotting, and Saving Measurement ResultsConfiguring the Analyzer to Produce a Time StampConfiguring the Analyzer to Produce a Time StampYo

1-12Making MeasurementsUsing Display FunctionsViewing Both Primary Measurement ChannelsIn some cases, you may want to view more than one measured para

4-34Printing, Plotting, and Saving Measurement ResultsPrinting or Plotting the List Values or Operating ParametersPrinting or Plotting the List Values

4-35Printing, Plotting, and Saving Measurement ResultsSolving Problems with Printing or PlottingSolving Problems with Printing or PlottingIf you encou

4-36Printing, Plotting, and Saving Measurement ResultsSaving and Recalling Instrument StatesSaving and Recalling Instrument StatesPlaces Where You Can

4-37Printing, Plotting, and Saving Measurement ResultsSaving and Recalling Instrument StatesWhat You Can Save to a Floppy DiskYou can save an instrume

4-38Printing, Plotting, and Saving Measurement ResultsSaving an Instrument StateSaving an Instrument State1. Press and select one of the storage devi

4-39Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsSaving Measurement ResultsInstrument states combined with measurements

4-40Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsFigure 4-13 Data Processing Flow DiagramNOTE If the analyzer has an ac

4-41Printing, Plotting, and Saving Measurement ResultsSaving Measurement Resultsis stored to disk in IEEE-64 bit real format (for LIF disks), and 32 b

4-42Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsIf , or , or is selected, a CITIfileis saved for each displayed channe

4-43Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsThe "format" choice is selected by the current selection und

1-13Making MeasurementsUsing Display FunctionsFigure 1-8 Example Dual Channel with Split Display On3. To return to a single-graticule display, press:

4-44Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsSaving in Textual (CSV) FormTextual measurement results can be saved i

4-45Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsHow the Analyzer Names These Files SequentiallyWhen text files are save

4-46Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsInstrument State FilesWhen an instrument state is saved to a floppy dis

4-47Printing, Plotting, and Saving Measurement ResultsSaving Measurement Results(CITIfile format), without any direct frequency information. S11 appear

4-48Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsFiles with .g0 File ExtensionFileXX.g0, produced only when is turned

4-49Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsRaw ArraysOn the analyzer, press theData created the first time in this

4-50Printing, Plotting, and Saving Measurement ResultsRe-Saving an Instrument StateRe-Saving an Instrument StateIf you re-save a file, the analyzer ove

4-51Printing, Plotting, and Saving Measurement ResultsDeleting a FileDeleting a File1. Press .2. Choose from the following storage devices:❏❏❏ (If ne

4-52Printing, Plotting, and Saving Measurement ResultsRenaming a FileRenaming a File1. Press .2. Choose from the following storage devices:❏❏❏ (If ne

4-53Printing, Plotting, and Saving Measurement ResultsRecalling a FileRecalling a File1. Press .2. Choose from the following storage devices:❏❏❏ (If

1-14Making MeasurementsUsing Display FunctionsDual Channel Mode with Decoupled Channel PowerBy decoupling the channel power or port power and using th

4-54Printing, Plotting, and Saving Measurement ResultsSolving Problems with Saving or Recalling FilesSolving Problems with Saving or Recalling FilesIf

5-15 Optimizing Measurement Results

5-2Optimizing Measurement ResultsUsing This ChapterUsing This ChapterThis chapter describes techniques and analyzer functions that help you achieve th

5-3Optimizing Measurement ResultsTaking Care of Microwave ConnectorsTaking Care of Microwave ConnectorsProper connector care and connection techniques

5-4Optimizing Measurement ResultsIncreasing Measurement AccuracyIncreasing Measurement AccuracyThe following all contribute to loss of accuracy in a m

5-5Optimizing Measurement ResultsIncreasing Measurement AccuracyTemperature DriftElectrical characteristics will change with temperature due to the th

5-6Optimizing Measurement ResultsIncreasing Measurement AccuracyYou can activate a port extension by pressing. Then enter the delay to the reference p

5-7Optimizing Measurement ResultsMaintaining Test Port Output Power During Sweep RetraceMaintaining Test Port Output Power During SweepRetraceDuring s

5-8Optimizing Measurement ResultsMaking Accurate Measurements of Electrically Long DevicesMaking Accurate Measurements of Electrically LongDevicesA de

5-9Optimizing Measurement ResultsMaking Accurate Measurements of Electrically Long DevicesDecreasing the Sweep RateThe sweep rate can be decreased by

1-15Making MeasurementsUsing Display Functions3. Press , set to ON, set toON, and set to .The display will appear as shown in Figure 1-9. Channel 1

5-10Optimizing Measurement ResultsIncreasing Sweep SpeedIncreasing Sweep SpeedYou can increase the analyzer sweep speed by avoiding the use of some fe

5-11Optimizing Measurement ResultsIncreasing Sweep SpeedSweep Speed-Related ErrorsIF delay occurs during swept measurements when the signal from the a

5-12Optimizing Measurement ResultsIncreasing Sweep SpeedTo Set the Auto Sweep Time ModeAuto sweep time mode is the default mode (the preset mode). Thi

5-13Optimizing Measurement ResultsIncreasing Sweep SpeedTo View a Single Measurement ChannelViewing a single channel will increase the measurement spe

5-14Optimizing Measurement ResultsIncreasing Sweep Speed• Continuous: In this mode the analyzer will switch between the test ports on everysweep. Alth

5-15Optimizing Measurement ResultsIncreasing Dynamic RangeIncreasing Dynamic RangeDynamic range is the difference between the analyzer's maximum

5-16Optimizing Measurement ResultsReducing NoiseReducing NoiseYou can use two analyzer functions to help reduce the effect of noise on the data trace:

5-17Optimizing Measurement ResultsReducing NoiseTo Use Direct Sampler Access Configurations (Option 012 Only)Direct sampler access to both the A and B

5-18Optimizing Measurement ResultsReducing Receiver CrosstalkReducing Receiver CrosstalkTo reduce receiver crosstalk you can do the following:• Perfor

6-16 Calibrating for IncreasedMeasurement Accuracy

1-16Making MeasurementsUsing Display FunctionsFigure 1-10 Four-Channel Display5. Press .Observe that the amber LED adjacent to the key is lit and the

6-2Calibrating for Increased Measurement AccuracyHow to Use This ChapterHow to Use This ChapterThis chapter is divided into the following subjects:• C

6-3Calibrating for Increased Measurement AccuracyIntroductionIntroductionThe accuracy of network analysis is greatly influenced by factors external to

6-4Calibrating for Increased Measurement AccuracyCalibration ConsiderationsCalibration ConsiderationsMeasurement ParametersCalibration procedures are

6-5Calibrating for Increased Measurement AccuracyCalibration Considerations• Greater than 100 dB: Same as 90 to 100 dB, but alternate mode should be u

6-6Calibrating for Increased Measurement AccuracyCalibration Considerations• The standard is an open termination, which by definition exhibits a certai

6-7Calibrating for Increased Measurement AccuracyCalibration Considerations3.5-mm male Offset Open3.5-mm female2.4-mm male2.4-mm femaleType-N female75

6-8Calibrating for Increased Measurement AccuracyCalibration ConsiderationsFigure 6-1 Typical Responses of Calibration Standards after CalibrationInte

6-9Calibrating for Increased Measurement AccuracyCalibration Considerationsin use, the notation C∆ will appear on the analyzer display.NOTE The preset

6-10Calibrating for Increased Measurement AccuracyProcedures for Error Correcting Your MeasurementsProcedures for Error Correcting Your MeasurementsTh

6-11Calibrating for Increased Measurement AccuracyProcedures for Error Correcting Your MeasurementsNOTE Response calibration is not as accurate as oth

iiiSafety NotesThe following safety notes are used throughout this manual. Familiarize yourself witheach of the notes and its meaning before operating

1-17Making MeasurementsUsing Display Functions9. To independently control the channel markers:Press , set to UNCOUPLED.Rotate the front panel control

6-12Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsFrequency Response Error CorrectionsYou can remove the frequency

6-13Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsFigure 6-2 Standard Connections for a Response Error Correction

6-14Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsResponse Error Correction for Transmission Measurements1. Press

6-15Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsNOTE Do not use an open or short standard for a transmission res

6-16Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsFigure 6-4 Standard Connections for a Receiver Calibration3. To

6-17Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error CorrectionsFrequency Response and Isolation Error Corrections

6-18Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error Corrections7. Make a "thru" connection between the

6-19Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error Corrections11.To measure the calibration standard, press:12.R

6-20Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error Corrections5. If your calibration kit is different than the k

6-21Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error CorrectionsThe analyzer displays WAIT - MEASURING CAL STANDAR

1-18Making MeasurementsUsing Display Functions4 Param Displays SoftkeyThe menu does two things:• provides a quick way to set up a four-parameter disp

6-22Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error CorrectionEnhanced Frequency Response Error CorrectionThe enhanced

6-23Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error CorrectionFigure 6-7 Standard Connections for Enhanced Response Ca

6-24Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error CorrectionNOTE Include any adapters or cables that you will have i

6-25Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error Correction18.To compute the error coefficients, press:The analyzer

6-26Calibrating for Increased Measurement AccuracyOne-Port Reflection Error CorrectionOne-Port Reflection Error Correction• removes directivity errors o

6-27Calibrating for Increased Measurement AccuracyOne-Port Reflection Error CorrectionNOTE Include any adapters that you will have in the device measur

6-28Calibrating for Increased Measurement AccuracyOne-Port Reflection Error Correction13.To compute the error coefficients, press:The analyzer displays

6-29Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)Full Two-Port Error Correction (ES Analyzers Only)

6-30Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)Figure 6-9 Standard Connections for Full Two-Port

6-31Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)14.Make a "thru" connection between the

1-19Making MeasurementsUsing Display FunctionsUsing Memory Traces and Memory Math FunctionsThe analyzer has four available memory traces, one per chan

6-32Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)17.To compute the error coefficients, press:The ana

6-33Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationPower Meter Measurement CalibrationA GPIB-compatible power meter

6-34Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationInterpolation in Power Meter CalibrationIf the frequency is chang

6-35Calibrating for Increased Measurement AccuracyPower Meter Measurement Calibration3. Press and then press either the or key,depending on which p

6-36Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationNOTE Remember to subtract the through arm loss from the coupler a

6-37Calibrating for Increased Measurement AccuracyPower Meter Measurement Calibration3. Select the analyzer as the system controller:4. Set the power

6-38Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationUsing Continuous Correction ModeYou can set the analyzer to updat

6-39Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationTo Calibrate the Analyzer Receiver to Measure Absolute PowerYou c

6-40Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesCalibrating for Noninsertable DevicesA test device having the s

6-41Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesFigure 6-13 Adapters NeededThe following requirements must also

1-20Making MeasurementsUsing Display FunctionsTo View the Measurement Data and Memory TraceThe analyzer default setting shows you the current measurem

6-42Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesPerform the 2-port Error Corrections1. Connect adapter A3 to ad

6-43Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable Devices6. Save the results to disk. Name the file "PORT2."7.

6-44Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable Devices16.To save the results of the new cal set, press.NOTE Adapter r

6-45Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesMatched AdaptersWith this method, you use two precision matched

6-46Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesModify the Cal Kit Thru DefinitionWith this method, it is only n

6-47Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable Devices10.Perform the desired calibration with this new user kit.11.Co

6-48Calibrating for Increased Measurement AccuracyMinimizing Error When Using AdaptersMinimizing Error When Using AdaptersTo minimize the error introd

6-49Calibrating for Increased Measurement AccuracyMaking Non-Coaxial MeasurementsMaking Non-Coaxial MeasurementsNon-coaxial, on-wafer measurements pre

6-50Calibrating for Increased Measurement AccuracyMaking Non-Coaxial MeasurementsIf You Want to Design Your Own FixtureIdeally, a fixture should provid

6-51Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)Calibrating for Non-Coaxial Devices (ES Analy

1-21Making MeasurementsUsing Display FunctionsBlanking the DisplayPressing switches off the analyzerdisplay while leaving the instrument in its curre

6-52Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)6. For the purposes of this example, change t

6-53Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)Perform the TRL Calibration1. Press.2. To mea

6-54Calibrating for Increased Measurement AccuracyLRM Error Correction11.Connect the load to PORT 1, and press:12.You may repeat any of the previous s

6-55Calibrating for Increased Measurement AccuracyLRM Error Correction3. Press the following keys:4. To define the THRU/LINE standard, press:5. To defin

6-56Calibrating for Increased Measurement AccuracyLRM Error CorrectionLabel the Calibration Kit18.Press and create a label up to 8 characters long. F

6-57Calibrating for Increased Measurement AccuracyLRM Error Correction10.Connect the load to PORT 2 and press .11.Repeat the previous LRM load measure

7-17 Operating Concepts

7-2Operating ConceptsUsing This ChapterUsing This ChapterThis chapter provides conceptual information on how specific functions of the networkanalyzer

7-3Operating ConceptsSystem OperationSystem OperationNetwork analyzers measure the reflection and transmission characteristics of devices andnetworks.

7-4Operating ConceptsSystem Operationto a highly stable crystal oscillator. For this purpose, a portion of the transmitted signal isrouted to the R ch

1-22Making MeasurementsUsing Display FunctionsYou may choose to change the default colors to suit environmental needs, individualpreferences, or to ac

7-5Operating ConceptsProcessing ProcessingThe analyzer's receiver converts the R, A, and B input signals into useful measurementinformation. This

7-6Operating ConceptsProcessingWhile only a single flow path is shown, two identical paths are available, corresponding tochannel 1 and channel 2. Each

7-7Operating ConceptsProcessingPre-Raw Data ArraysThese data arrays store the results of all the preceding data processing operations. (Up tothis poin

7-8Operating ConceptsProcessingTransform (Option 010 Only)This transform converts frequency domain information into the time domain when it isactivate

7-9Operating ConceptsOutput PowerOutput PowerUnderstanding the Power RangesThe built-in synthesized source contains a programmable step attenuator tha

7-10Operating ConceptsOutput PowerNOTE After measurement calibration, you can change the power within a range andstill maintain nearly full accuracy.

7-11Operating ConceptsSweep TimeSweep TimeThe softkey selects sweep time as the active entry and shows whetherthe automatic or manual mode is active.

7-12Operating ConceptsSweep TimeIn addition to the these parameters, the actual cycle time of the analyzer is also dependenton the following measureme

7-13Operating ConceptsSource Attenuator Switch ProtectionSource Attenuator Switch ProtectionThe programmable step attenuator of the source can be swit

7-14Operating ConceptsChannel Stimulus CouplingChannel Stimulus Coupling toggles the channel coupling of stimulus values. With (the preset condition),

1-23Making MeasurementsUsing Display Functions softkey and turn the analyzer front panel knob. If additional adjustmentis needed, vary the degree of w

7-15Operating ConceptsSweep TypesSweep TypesThe following sweep types will function with the interpolated error-correction feature(described in “Inter

7-16Operating ConceptsSweep TypesNOTE Earlier 8719, 8720, and 8722 models allowed a maximum of 1632 points, butthis value was reduced to 1601 to add t

7-17Operating ConceptsSweep TypesThe frequency subsweeps, or segments, can be defined in any of the following terms:• start/stop/number of points• star

7-18Operating ConceptsSweep TypesThe frequency subsweeps, or segments, can be defined in any of the following terms:• start/stop/number of points/power

7-19Operating ConceptsSweep TypesSetting Segment IF BandwidthTo enable the function, you must first select inthe edit subsweep menu. List IF bandwidt

7-20Operating ConceptsS-ParametersS-ParametersThe key accesses the S-parameter menu which contains softkeys that can be usedto select the parameters

7-21Operating ConceptsS-ParametersFigure 7-3 S-Parameters of a Two-Port DeviceS-parameters are exactly equivalent to these more common description ter

7-22Operating ConceptsS-ParametersThe S-Parameter MenuThe S-parameter menu allows you to define the input ports and test set direction forS-parameter m

7-23Operating ConceptsS-ParametersFigure 7-4 Reflection Impedance and Admittance ConversionsIn a transmission measurement, the data can be converted to

7-24Operating ConceptsAnalyzer Display FormatsAnalyzer Display FormatsThe key accesses the format menu. This menu allows you to select theappropriate

1-24Making MeasurementsUsing MarkersUsing MarkersThe key displays a movable active marker on the screen and provides access to aseries of menus to con

7-25Operating ConceptsAnalyzer Display FormatsFigure 7-7 Phase FormatGroup Delay FormatThe softkey selects the group delay format, with marker values

7-26Operating ConceptsAnalyzer Display FormatsSmith Chart FormatThe softkey displays a Smith chart format. Refer to Figure 7-9. This isused in reflect

7-27Operating ConceptsAnalyzer Display FormatsPolar FormatThe softkey displays a polar format as shown in Figure 7-10. Each point on thepolar format

7-28Operating ConceptsAnalyzer Display FormatsLinear Magnitude FormatThe softkey displays the linear magnitude format as shown in Figure 7-11.This is

7-29Operating ConceptsAnalyzer Display FormatsSWR FormatThe softkey reformats a reflection measurement into its equivalent SWR (standingwave ratio) va

7-30Operating ConceptsAnalyzer Display FormatsImaginary FormatThe softkey displays only the imaginary (reactive) portion of the measureddata on a Car

7-31Operating ConceptsAnalyzer Display FormatsFigure 7-15 Higher Order Phase ShiftThe analyzer computes group delay from the phase slope. Phase data i

7-32Operating ConceptsAnalyzer Display FormatsFigure 7-17 Variations in Frequency ApertureIn determining the group delay aperture, there is a trade-of

7-33Operating ConceptsElectrical DelayElectrical DelayThe softkey adjusts the electrical delay to balance the phase of thetest device. This softkey mu

7-34Operating ConceptsNoise Reduction TechniquesNoise Reduction TechniquesThe key is used to access three different noise reduction techniques: sweep-

1-25Making MeasurementsUsing MarkersNOTE Using will also affect marker search and positioningfunctions when the value entered in a search or positioni

7-35Operating ConceptsNoise Reduction Techniquessufficiently high number of display points to avoid misleading results. Do not usesmoothing for measure

7-36Operating ConceptsNoise Reduction TechniquesIF Bandwidth ReductionIF bandwidth reduction lowers the noise floor by digitally reducing the receiver

7-37Operating ConceptsMeasurement CalibrationMeasurement CalibrationMeasurement calibration is an accuracy enhancement procedure that effectively remo

7-38Operating ConceptsMeasurement CalibrationWhat Causes Measurement Errors?Network analysis measurement errors can be separated into systematic, rand

7-39Operating ConceptsMeasurement Calibrationdirectivity is the vector sum of all leakage signals appearing at the analyzer receiverinput.The error co

7-40Operating ConceptsMeasurement CalibrationFigure 7-23 Load MatchThe error contributed by load match is dependent on the relationship between the ac

7-41Operating ConceptsMeasurement CalibrationCharacterizing Microwave Systematic ErrorsOne-Port Error ModelIn a measurement of the reflection coefficien

7-42Operating ConceptsMeasurement CalibrationHowever, all of the incident signal does not always reach the unknown. Refer to Figure7-26. Some of (I) m

7-43Operating ConceptsMeasurement CalibrationFrequency response (tracking) error is caused by variations in magnitude and phaseflatness versus frequenc

7-44Operating ConceptsMeasurement CalibrationFigure 7-29 "Perfect Load" TerminationSince the measured value for directivity is the vector su

1-26Making MeasurementsUsing MarkersFigure 1-13 Active and Inactive Markers Example• To switch off all of the markers, press:To Move Marker Informatio

7-45Operating ConceptsMeasurement CalibrationNext, a short circuit termination whose response is known to a very high degree is used toestablish anoth

7-46Operating ConceptsMeasurement CalibrationDevice MeasurementNow the unknown is measured to obtain a value for the measured response, S11M, at eachf

7-47Operating ConceptsMeasurement CalibrationFigure 7-34 Major Sources of ErrorThe transmission coefficient is measured by taking the ratio of the inci

7-48Operating ConceptsMeasurement CalibrationFigure 7-36 Load Match ELFThe measured value, S21M, consists of signal components that vary as a function

7-49Operating ConceptsMeasurement CalibrationIn this case, omitting isolation is better than measuring the isolation standards withoutincreasing the a

7-50Operating ConceptsMeasurement CalibrationFigure 7-38 Full Two-Port Error Model A full two-port error model equations for all four S-parameters of

7-51Operating ConceptsMeasurement CalibrationFigure 7-39 Full Two-Port Error Model Equations

7-52Operating ConceptsMeasurement CalibrationHow Effective Is Accuracy Enhancement?In addition to the errors removed by accuracy enhancement, other sy

7-53Operating ConceptsMeasurement CalibrationFigure 7-41 Response versus S11 1-Port Calibration on Smith ChartThe response of a device in a log magnit

7-54Operating ConceptsCalibration RoutinesCalibration RoutinesThere are twelve different error terms for a two-port measurement that can be correctedb

ivDocumentation MapThe Installation and Quick Start Guide provides procedures forinstalling, configuring, and verifying the operation of the analyzer.

1-27Making MeasurementsUsing MarkersFigure 1-14 Marker Information Moved into the Softkey Menu Area4. Restore the softkey menu and move the marker inf

7-55Operating ConceptsCalibration RoutinesFull Two-Port Calibration (ES Models Only)The full two-port calibration, activated by pressing the softkey w

7-56Operating ConceptsModifying Calibration KitsModifying Calibration KitsModifying calibration kits is necessary only if unusual standards (such as i

7-57Operating ConceptsModifying Calibration KitsProcedureThe following steps are used to modify or define a user kit:1. Select the predefined kit to be

7-58Operating ConceptsModifying Calibration Kits• leads to a menu for constructing a label for the user-modified cal kit. If alabel is supplied, it wi

7-59Operating ConceptsModifying Calibration KitsAfter a standard number is entered, selection of the standard type will present one of fivemenus for en

7-60Operating ConceptsModifying Calibration Kits— defines the load as being offset.• defines the standard type as a transmission line of specified lengt

7-61Operating ConceptsModifying Calibration KitsLastly, the standard must be defined as either coaxial or waveguide. If it is waveguide,dispersion effe

7-62Operating ConceptsModifying Calibration KitsSpecify Class MenuOnce a standard has been defined, it must be assigned to a standard "class."

7-63Operating ConceptsModifying Calibration KitsThe number of standard classes required depends on the type of calibration beingperformed, and is iden

7-64Operating ConceptsModifying Calibration Kits• allows you to enter the standard numbers for a response calibration. Thiscalibration corrects for fr

1-28Making MeasurementsUsing MarkersFigure 1-15 Marker Information on the GraticulesYou can also restore the softkey menu by pressing a hardkey which

7-65Operating ConceptsModifying Calibration KitsNOTE The published specifications for this network analyzer system includeaccuracy enhancement with com

7-66Operating ConceptsTRL*/LRM* Calibration (ES Models Only)TRL*/LRM* Calibration (ES Models Only)The network analyzer has the capability of making ca

7-67Operating ConceptsTRL*/LRM* Calibration (ES Models Only)TRL TerminologyNotice that the letters TRL, LRL, LRM, etc. are often interchanged, dependi

7-68Operating ConceptsTRL*/LRM* Calibration (ES Models Only)while the reverse source match (ESR) and forward load match (ELF) are both representedby ε

7-69Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Figure 7-44 8-term TRL (or TRL*) Error Model and Generalized CoefficientsSource match and l

7-70Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Improving Raw Source Match and Load Match for TRL*/LRM*CalibrationA technique that can be

7-71Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Transmission magnitude uncertainty = EX + ETS21 + ESS11S21 + ELS22S21where:ED = effective

7-72Operating ConceptsTRL*/LRM* Calibration (ES Models Only)• Attenuation of the thru need not be known.• If the thru is used to set the reference pla

7-73Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Fabricating and defining calibration standards for TRL/LRMWhen calibrating a network analyz

7-74Operating ConceptsTRL*/LRM* Calibration (ES Models Only)where:f = frequencyl = length of linev = velocity = speed of light × velocity factorwhich

1-29Making MeasurementsUsing MarkersFigure 1-16 Marker 1 as the Reference Marker Example4. To change the reference marker to marker 2, press:To Activa

7-75Operating ConceptsTRL*/LRM* Calibration (ES Models Only)The TRM calibration technique is related to TRL with the difference being that it basesthe

7-76Operating ConceptsTRL*/LRM* Calibration (ES Models Only)specified to have zero delay, the reference plane will be established in the middle of thet

7-77Operating ConceptsGPIB OperationGPIB OperationThis section contains information on the following topics:• local key• GPIB controller modes• instru

7-78Operating ConceptsGPIB OperationGPIB STATUS IndicatorsWhen the analyzer is connected to other instruments over GPIB, the GPIB STATUSindicators in

7-79Operating ConceptsGPIB OperationAddress MenuThis menu can be accessed by pressing the softkey within the GPIBmenu.In communications through the G

7-80Operating ConceptsGPIB OperationThe GPIO ModeThe GPIO mode turns the parallel port into a "general purpose input/output" port.In this mo

7-81Operating ConceptsLimit Line OperationLimit Line OperationThis menu can be accessed by pressing within the systemmenu.You can have limit lines dr

7-82Operating ConceptsLimit Line OperationIf limit lines are on, they are plotted with the data on a plot. If limit testing is on, the PASSor FAIL mes

7-83Operating ConceptsKnowing the Instrument ModesKnowing the Instrument ModesThere are five major instrument modes of the analyzer:• network analyzer

7-84Operating ConceptsKnowing the Instrument ModesFigure 7-46 Typical Test Setup for Tuned Receiver ModeTuned Receiver Mode In-Depth DescriptionIf you

1-30Making MeasurementsUsing MarkersFigure 1-17 Example of a Fixed Reference Marker Using MKR ZEROUsing the Key to Activate a Fixed Reference Marker1

7-85Operating ConceptsDifferences between 8753 Network AnalyzersDifferences between 8753 Network AnalyzersTable 7-3 Comparing the 8753A/B/C/DFeature 8

7-86Operating ConceptsDifferences between 8753 Network AnalyzersTable 7-4 Comparing the 8753D/E/ESFeature 8753D8753E 8753ESFully integrated measuremen

7-87Operating ConceptsDifferences between 8753 Network AnalyzersInterfaces: RS-232, parallel, and DIN keyboard Yes Yes YesUser-defined preset Yes Yes Y

7-88Operating ConceptsDifferences between 8753 Network AnalyzersColor display Yes Yes YesFlat panel LCD No Yes YesVGA output No Yes NoDelete display (

8-18 Safety and Regulatory Information

8-2Safety and Regulatory InformationGeneral InformationGeneral InformationMaintenanceClean the cabinet, using a dry or damp cloth only.WARNING To prev

8-3Safety and Regulatory InformationGeneral InformationTable 8-1 Agilent Technologies Sales and Service OfficesUNITED STATESInstrument Support CenterAg

8-4Safety and Regulatory InformationSafety SymbolsSafety SymbolsThe following safety symbols are used throughout this manual. Familiarize yourself wit

8-5Safety and Regulatory InformationSafety ConsiderationsSafety ConsiderationsNOTE This instrument has been designed and tested in accordance with IEC

8-6Safety and Regulatory InformationSafety ConsiderationsServicingWARNING No operator serviceable parts inside. Refer servicing to qualifiedpersonnel.

1-31Making MeasurementsUsing MarkersFigure 1-18 Example of a Fixed Reference Marker Using (∆)REF=(∆)FIXED MKRTo Couple and Uncouple Display MarkersAt

8-7Safety and Regulatory InformationSafety ConsiderationsCAUTION This product is designed for use in Installation Category II and PollutionDegree 2 pe

8-8Safety and Regulatory InformationDeclaration of ConformityDeclaration of Conformity

IndexIndex-1Numerics2-port error corrections,performing, 6-424 Param Displays softkey, 1-18Aaborting a print or plot process,4-33absoluteripple test v

Index-2Indexcalling the next measurementsequence,2-29capabilitiesmixer measurement,2-3capacitance, fringe,6-6cause of measurement problems,5-8center f

IndexIndex-3viewing, 1-14measurement datadividing by the memory trace,1-20subtracting memory trace,1-20viewing, 1-20memory math functions, 1-19memory

Index-4IndexChannel Position softkey, 1-17customizing, 1-17viewing, 1-14Freelance, using, 4-23frequencysegments, editing, 6-34signals, deleting, 6-35s

IndexIndex-5reducing the averaging factor,5-12reducing the number ofmeasurement points, 5-12setting the auto sweep timemode, 5-12setting the sweep typ

Index-6IndexMmagnitudemeasuring, 1-7measuring response, 1-7maintaining testport outputpower during sweep retrace,5-7maintenance, 8-2making a basic mea

IndexIndex-7viewing, 1-20memory, display, 7-8menuaddress, 7-79analog in, 7-22calibration kit, 7-57conversion, 7-22edit limits, 7-82edit segment, 7-82i

Index-8Indexphase or group delaymeasurements, 2-34phaselinearityandgroupdelay,2-34phase measurements, 2-34places where you can save, 4-36plotaborting

1-32Making MeasurementsUsing MarkersTo Use Polar Format MarkersThe analyzer can display the marker value as magnitude and phase, or as areal/imaginary

IndexIndex-9effect of spurious responses, 2-5number of measurement points,5-12reducing recall time, 5-18reducing trace noise, 5-16activating averaging

Index-10Indexgeneratingfiles in aloopcounterexample, 1-115in-depth information, 1-105jumps to itself, 1-112limit test example, 1-117loading from a disk

IndexIndex-11temperature drift,5-5terminology, TRL,7-67testbandwidth,1-92–1-97ripple limit,1-82–1-91test port coupling,7-10testportinputpower,increasi

Index-12IndexI/O menu, 1-108input decision making, 1-108out menu, 1-111output for controllingperipherals, 1-108tuned receiver mode, 2-26, 2-28,7-83in-

1-33Making MeasurementsUsing MarkersTo Use Smith Chart MarkersFor greater accuracy when using markers in the Smith chart format, activate the discrete

1-34Making MeasurementsUsing MarkersFigure 1-21 Example of Impedance Smith Chart MarkersTo Set Measurement Parameters Using MarkersThe analyzer allows

1-35Making MeasurementsUsing MarkersSetting the Stop Frequency1. Press and turn the front panel knob, or enter a value from the front panelkeypad to p

1-36Making MeasurementsUsing MarkersFigure 1-24 Example of Setting the Center Frequency Using a MarkerSetting the Frequency SpanYou can set the span e

ContentsContents-v1. Making MeasurementsUsing This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-37Making MeasurementsUsing MarkersFigure 1-25 Example of Setting the Frequency Span Using MarkerSetting the Display Reference Value1. Press and turn

1-38Making MeasurementsUsing MarkersSetting the Electrical DelayThis feature adds phase delay to a variation in phase versus frequency, therefore it i

1-39Making MeasurementsUsing MarkersTo Search for a Specific AmplitudeThese functions place the marker at an amplitude-related point on the trace. If y

1-40Making MeasurementsUsing MarkersFigure 1-29 Example of Searching for the Minimum Amplitude Using a MarkerSearching for a Target Amplitude1. Press

1-41Making MeasurementsUsing MarkersSearching for a BandwidthThe analyzer can automatically calculate and display the bandwidth (BW:), centerfrequency

1-42Making MeasurementsUsing MarkersTo Calculate the Statistics of the Measurement DataThis function calculates the mean, standard deviation, and peak

1-43Making MeasurementsMeasuring Electrical Length and Phase DistortionMeasuring Electrical Length and Phase DistortionElectrical LengthThe analyzer m

1-44Making MeasurementsMeasuring Electrical Length and Phase DistortionYou may also want to select settings for the number of data points, averaging,

1-45Making MeasurementsMeasuring Electrical Length and Phase DistortionAlternatively, press and turn the front panel knobto increase the electrical l

1-46Making MeasurementsMeasuring Electrical Length and Phase DistortionMeasuring Phase DistortionThis portion of the example shows you how to measure

Contents-viContentsUsing Limit Lines to Test a Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-73Set

1-47Making MeasurementsMeasuring Electrical Length and Phase DistortionGroup DelayThe phase linearity of many devices is specified in terms of group or

1-48Making MeasurementsMeasuring Electrical Length and Phase DistortionWhen you increase the aperture, the analyzer removes fine grain variations from

1-49Making MeasurementsMeasuring Electrical Length and Phase DistortionGroup delay is calculated by dividing the phase difference between points by th

1-50Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)Characterizing a Duplexer (ES Analyzers Only)This measurement example demonstrates

1-51Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)3. Set up channel 1 for the Tx-Ant stimulus parameters (start/stop frequency, powe

1-52Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)15.Set up a 2-graticule, 4-parameter display with transmission measurements on the

1-53Making MeasurementsMeasuring AmplifiersMeasuring AmplifiersThe analyzer allows you to measure the transmission and reflection characteristics ofmany

1-54Making MeasurementsMeasuring AmplifiersMeasuring Gain CompressionGain compression occurs when the input power of an amplifier is increased to a leve

1-55Making MeasurementsMeasuring Amplifiers4. To produce a normalized trace that represents gain compression, perform either step 5or step 6. (Step 5 u

1-56Making MeasurementsMeasuring AmplifiersFigure 1-44 Gain Compression Using Linear Sweep and12.If was selected, recouple the channel stimulus by pre

ContentsContents-viiPerforming a Power Meter (Source) Calibration Over the IF Range. . . . . . . . . . . . . . . . .2-14Setting the Analyzer to the RF

1-57Making MeasurementsMeasuring AmplifiersNOTE A receiver calibration will improve the accuracy of this measurement. Referto Chapter 6 , “Calibrating

1-58Making MeasurementsMeasuring AmplifiersMeasuring Gain and Reverse Isolation Simultaneously(ES Analyzers Only)Since an amplifier will have high gain

1-59Making MeasurementsMeasuring AmplifiersFigure 1-46 Gain and Reverse Isolation

1-60Making MeasurementsMeasuring AmplifiersMaking High Power Measurements with Option 085(ES Analyzers Only)Analyzers equipped with Option 085 can be c

1-61Making MeasurementsMeasuring Amplifiers5. Switch on the booster amplifier.6. Using a power meter, measure the output power from the coupled arm and

1-62Making MeasurementsMeasuring AmplifiersFigure 1-48 High Power Test Setup (Step 2a)Figure 1-49 High Power Test Setup (Step 2b)Selecting Power Ranges

1-63Making MeasurementsMeasuring Amplifiers16.Estimate the maximum amount of gain that could be provided by the DUT and, as aresult, the maximum amount

1-64Making MeasurementsMeasuring AmplifiersWith the previous points in mind, the amount of attenuation can be calculated from thefollowing equations:•

1-65Making MeasurementsMeasuring AmplifiersFigure 1-51 High Power Test Setup (Step 3)26.Make any other desired high power measurements.Ratio measuremen

1-66Making MeasurementsMeasuring AmplifiersMaking High Power Measurements with Option 012(ES Analyzers Only)Analyzers equipped with Option 012 can be c

Contents-viiiContentsSelecting Gate Shape . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3

1-67Making MeasurementsMeasuring AmplifiersWith the previous points in mind, the amount of attenuation can be calculated from thefollowing equations:•

1-68Making MeasurementsUsing the Swept List Mode to Test a DeviceUsing the Swept List Mode to Test a DeviceWhen using a list frequency sweep, the anal

1-69Making MeasurementsUsing the Swept List Mode to Test a Device2. Set the following measurement parameters: or on ET models:Observe the Characterist

1-70Making MeasurementsUsing the Swept List Mode to Test a DeviceSet Up the Lower Stopband Parameters3. To set up the segment for the lower stopband,

1-71Making MeasurementsUsing the Swept List Mode to Test a Device9. Press .Calibrate and Measure1. Remove the DUT and perform a full two-port calibrat

1-72Making MeasurementsUsing the Swept List Mode to Test a DeviceFigure 1-57 Filter Measurements Using Linear Sweep and Swept List Mode(Power: 0 dBm/I

1-73Making MeasurementsUsing Limit Lines to Test a DeviceUsing Limit Lines to Test a DeviceLimit testing is a measurement technique that compares meas

1-74Making MeasurementsUsing Limit Lines to Test a DeviceYou may also want to select settings for the number of data points, power, averaging,and IF b

1-75Making MeasurementsUsing Limit Lines to Test a Device4. To define the limit as a flat line, press:5. To terminate the flat line segment by establishi

1-76Making MeasurementsUsing Limit Lines to Test a Device• To create a limit line that tests the high side of the bandpass filter, press:Figure 1-60 Ex

ContentsContents-ixSaving and Recalling Instrument States . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4-36Places Wh

1-77Making MeasurementsUsing Limit Lines to Test a Device2. To establish the start frequency and limits for a sloping limit line that tests the low si

1-78Making MeasurementsUsing Limit Lines to Test a DeviceCreating Single Point LimitsIn this example procedure, the following limits are set:• from −2

1-79Making MeasurementsUsing Limit Lines to Test a DeviceEditing Limit SegmentsThis example shows you how to edit the upper limit of a limit line.1. T

1-80Making MeasurementsUsing Limit Lines to Test a DeviceNOTE Selecting the beep fail indicator is optional and will addapproximately 50 ms of sweep

1-81Making MeasurementsUsing Limit Lines to Test a DeviceFigure 1-63 Example Stimulus Offset of Limit Lines• To return to 0 Hz offset, press:• To offs

1-82Making MeasurementsUsing Ripple Limits to Test a DeviceUsing Ripple Limits to Test a DeviceSetting Up the List of Ripple Limits to TestTwo tasks a

1-83Making MeasurementsUsing Ripple Limits to Test a DeviceFigure 1-65 Connections for an Example Ripple Test Measurement2. Press and choose the meas

1-84Making MeasurementsUsing Ripple Limits to Test a DeviceFigure 1-66 Filter Pass Band Before Ripple TestSetting Up Limits for Ripple TestingThis sec

1-85Making MeasurementsUsing Ripple Limits to Test a Devicebandpass or to customize the ripple test to meet your specific requirements.1. To access the

1-86Making MeasurementsUsing Ripple Limits to Test a DeviceThe frequency band number is located in the left column of the list of frequencybands.3. Ma