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The Agilent B2900A Series of Precision Source/
Measure Units are compact and cost-effective
bench-top Source/Measure Units (SMUs) with
the capability to source and measure both
voltage and current. These capabilities make
the B2900A Series ideal for a wide variety of IV
(current versus voltage) measurement tasks that
require both high resolution and accuracy.
The Agilent B2900A Series of SMUs provide
best-in-class performance for a modest price.
They have broad voltage (±210 V) and cur-
rent (± 3 A DC and ±10.5 A pulsed) sourcing
capability, excellent precision (minimum 10 fA/
100 nV sourcing and measuring resolution) and
possess a superior color LCD graphical
user interface (GUI). In addition, several
task-based viewing modes dramatically
improve productivity for test, debug
and characterization.
The Agilent B2900A Series offers unmatched
measurement throughput and supports conven-
tional SMU SCPI commands for easy test code
migration. These features improve effi ciency and
lower the cost of ownership when integrating
the SMUs into systems for production test.
The Agilent B2900A Series consists of four
models, the B2901A, B2902A, B2911A and
B2912A, differentiated through their available
features (number of digits displayed, measure-
ment resolution, minimum timing interval,
supported viewing modes, etc.) and by the
number of SMU channels (one or two) they
contain. This makes it easy to select the exact
price/performance point you require to meet
your testing needs.
Innovative SMU provides superior performance
and rapid measurement results
Feature Benefi t
Integrated 4-quadrant sourcing and
measuring capabilities
Easily and accurately measure current and voltage using a single instrument without the need manually
change any connections
Measurement range: ±210 V, ±3 A (DC),
±10.5 A (pulsed)
A single SMU product covers both high voltage and high current measurement needs, allowing for more
standardization and simplifying inventory and support concerns.
Source and measurement resolution down
to 10 fA and 100 nV
Can make low-level measurements using a low-cost bench-top SMU that were previously only possible
using a more expensive semiconductor device analyzer.
User-friendly front panel GUI with 4.3 inch
color LCD display supports both graphical
and numerical view modes
Can quickly and easily perform measurements and display data on the front panel, thereby greatly
speeding up interactive test, characterization and debug operations.
10 microsecond digitizing capability Can capture low frequency phenomena in addition to DC characteristics.
Free PC-based control software Can make measurements remotely from a PC without the need to program.
Supports both conventional and default
SCPI commands
Conventional SCPI commands provide some compatibility with older SMU code (such as Keithley 2400 se-
ries) to minimize code conversion work. Default SCPI commands support advanced B2900A Series features.
Small form factor with USB2.0, LAN, GPIB
and digital I/O interfaces
Easy integration into rack and stack systems.
Single view
Dual view
Roll view
(296 pagine)
(221 pagine)
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