5
Constant DC
Linear sweep Pulsed
linear sweep
Custom wave forms ( list sweep)
Logarithmic
sweep
Pulse
10 A
210 V
0.5 ms
200 μs
Load: 0.6 Ω
Load: open
Test up to 210 V and 3 A (DC) or 10.5
A (pulsed) with a single instrument
The B2900A SMUs can source and measure
voltages of ±210 V and currents of ±3 A (DC)
or ±10.5 A (pulsed). This versatility allows you
to standardize on a single SMU model and mini-
mize support costs. These capabilities are pres-
ent on both single and dual channel versions,
since on the 2-channel versions both channels
can be operated completely independently.
Integrated sweep and arbitrary
waveform measurement
functionality
The Agilent B2900A Series has capabilities that
allow it to perform more than just simple DC and
pulsed measurements. The B2900A SMUs have
a built-in sweep capability that supports all of
the standard sweep parameters such as linear
and logarithmic modes, single and double sweep
functions and constant and pulsed sweep opera-
tion. The B2900A GUI fully supports the sweep
measurement function, thereby allowing sweep
measurements to be made and displayed quickly
from the instrument front panel. Of course, the
user can also make the same sweep measure-
ments just as effi ciently on the B2900A SMUs
under remote control using SCPI commands.
This integrated sweep measurement capability
improves effi ciency and reduces measurement
setup time.
In addition to its resident sweep functionality, the
Agilent B2900A Series also supports arbitrary
waveform generation (AWG) and list sweep
capabilities. The AWG and list sweep functions
allow you to create waveforms with up to
2500 steps for maximum fl exibility, and enable
you to specify a waveform of arbitrary shape
using familiar spreadsheet compatible data-entry
formats. The AWG and list sweep features are
especially useful when characterizing devices
where the response varies greatly depending
upon the applied voltage or current, since they
give you the fl exibility to “zoom in” on areas
of interest.
Wide voltage and current coverage
for testing a variety of devices
Built-in functions provide fl exible
waveform generation
capabilities
You can create current pulses of up to 10.5 amps, which helps
to minimize device self-heating effects.
You can ramp up to a voltage of 200 V in 0.5 millisecond,
which is useful for evaluating high-power components.
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