Agilent Technologies 42A Specifiche Pagina 81
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81
Chapter 3: Testing Performance
To Test the Multiple-clock, Multiple-edge, State Acquisition
8 Using the Delay mode of the pulse generator channel 1, position the pulses
according to the setup/hold combination selected, +0.0 ps or -50 ps.
a On the Oscilloscope, select [Define meas] Define ∆Time - Stop edge:
falling.
b On the oscilloscope, select [Shift] ∆Time. Select Start src: channel 1,
then select [Enter] to display the setup time (∆Time(1)-(2)).
Adjust the pulse generator channel 1 Delay until the pulses are aligned
according to the setup time of the setup/hold combination selected, +0.0 ps or
-50 ps.
Disregard the Period(2) value. The settings provided in this procedure may measure
the period from rising edge to rising edge, which is not a valid measurement.
Data Signal
Clock Signal
Setup Time
- Logic Analyzer 1
- Features 2
- Service Strategy 2
- Application 2
- In This Book 4
- Contents 5
- General Information 9
- Accessories 10
- Specifications 11
- Characteristics 12
- Environmental Characteristics 12
- Recommended Test Equipment 13
- Preparing for Use 15
- Power Requirements 16
- Operating Environment 16
- To inspect the module 16
- To prepare the mainframe 17
- Chapter 2: Preparing for Use 19
- To install the module 26
- To turn on the system 28
- To test the module 28
- To clean the module 29
- Testing Performance 31
- Test Strategy 32
- Test Interval 32
- Test Record Description 32
- Test Equipment 32
- Instrument Warm-Up 32
- To Perform the Self-tests 33
- Perform the self-tests 34
- To Set Up the Test Connectors 35
- Materials Required 35
- Set up the equipment 38
- 5 Set up the oscilloscope 39
- Test the ECL threshold 43
- Test the 0 V User threshold 46
- Test the next pod 47
- QV 58
- QV 58
- -↓ .↓ /↓ 0↓ 64
- Acquisition 66
- 6HWXS+ROG&RPELQDWLRQV 76
- QV 76
- QV 76
- L↑ + M↑ 78
- QV 93
- QV 93
- -↕ .↕ /↕ 0↕ 95
- Connect the logic analyzer 102
- Acquire the data 102
- To Test the Multi-Card Module 105
- Set up the logic analyzer 106
- 4 Set up the Trigger tab 108
- 5 Set up the Listing window 109
- Verify the test signal 113
- Data Pulse 114
- Data Signal 114
- Clock Signal 114
- Setup Time 116
- -↑ .↑ /↑ 0↑ 117
- 5 Verify the test data 118
- Performance Test Record 121
- Calibrating 125
- Calibration Strategy 126
- Troubleshooting 127
- To use the flowcharts 128
- Chapter 5: Troubleshooting 129
- Troubleshooting Flowchart 1 129
- Troubleshooting Flowchart 2 130
- To run the self-tests 131
- To exit the test system 132
- To test the cables 133
- • open channel 137
- To test the auxiliary power 138
- Replacing Assemblies 139
- Tools Required 140
- To remove the module 140
- To replace the circuit board 142
- To replace the module 143
- To replace the probe cable 144
- To return assemblies 145
- Replaceable Parts 147
- Replaceable Parts Ordering 148
- Replaceable Parts List 149
- Chapter 7: Replaceable Parts 150
- Exploded View 151
- Theory of Operation 153
- Block-Level Theory 154
- Self-Tests Description 158
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