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15-6
Agilent Technologies E5500 Phase Noise Measurement System
Evaluating Your Measurement Results
Gathering More Data
Gathering More Data
Repeating the
Measurement
Making phase noise measurements is often an iterative process. The
information derived from the first measurement will sometimes indicate that
changes to the measurement setup are necessary for measuring a particular
device. When you make changes to the measurement setup (such as trying a
different signal source, shortening cables, or any other action recommended
in “Problem Solving” on page 15-13), repeating the measurement after each
change allows you to check the effect that the change has had on the total
noise graph.
To repeat a measurement, on the Measurement menu, click Repeat
Measurement.
Doing More Research If you are still uncertain about the validity of the measurement results, it may
be necessary to do further research to find other validating data for your
measurement. Additional information (such as typical noise curves for
devices similar to the unit-under-test or data sheets for components used in
the device) can often provide insights into the expected performance of the
unit-under-test.
- Agilent Technologies E5500A/B 1
- Trademarks 2
- Software License 3
- Third Party Software 4
- Termination 4
- Export Requirements 4
- Limited Warranty 6
- Service and Support 7
- Measurement System 17
- Introduction 18
- Training Guidelines 19
- Solutions 20
- beyond the 21
- System Series of Solutions 22
- 3 Your First Measurement 24
- Designed to Meet Your Needs 25
- Your First Measurement 26
- Making a Measurement 28
- Connect Diagram 31
- 4 Phase Noise Basics 34
- What is Phase Noise? 35
- • long-term stability 35
- • short-term stability 35
- Phase Noise Basics 36
- ConfiguringaSource 43
- Specify the Source 47
- Measurement Noise Floor 53
- Viewing Markers 95
- Omitting Spurs 96
- Exporting Measurement Results 100
- The Phase Lock Loop Technique 104
- Understanding the 105
- Phase-Lock Loop 105
- Technique 105
- The Phase Lock Loop 105
- Tuning Requirements 106
- • Tune Range of VCO, (±V) 107
- The System Noise 108
- The Noise Level of the 109
- Reference Source 109
- Selecting a Reference 110
- • Tuning Voltage Range (V) 111
- Tracking Frequency Drift 114
- Changing the PTR 116
- Signal Generators 117
- Minimizing Injection Locking 118
- Inserting a Device 120
- For Example 121
- Determining the Phase 122
- Lock Loop Bandwidth 122
- Measurement Options 125
- Absolute Measurement Examples 126
- Stable RF Oscillator 127
- Free-Running RF Oscillator 149
- RF Synthesizer using DCFM 173
- RF Synthesizer using EFC 197
- Microwave Source 222
- (V)X(Hz/V) 236
- HzRangeCapture 236
- ❍ Measured Beatnote,page8-16 241
- ❍ Double-Sided Spur,page8-21 241
- ❍ Single-Sided Spur,page8-24 241
- What is Residual Noise? 242
- Frequency Translation 244
- Calibration and 246
- Measurement 246
- Guidelines 246
- Calibrating the Measurement 247
- User Entry of Phase 249
- Detector Constant 249
- The Calibration Options 250
- Measured +/- DC Peak 253
- Advantages: 261
- Disadvantages: 261
- Measurement Difficulties 268
- Residual Measurement Examples 269
- Amplifier Measurement Example 270
- FM Discriminator Fundamentals 284
- The Discriminator 286
- Transfer Response 286
- Compression 288
- Double-Sided Spur Calibration 292
- Determining the 293
- Discriminator 293
- (Delay Line) Length 293
- Defining the 294
- amplitude for a known 297
- Connecting Cables 298
- Measurement Environment 298
- Beginning the 299
- Connect Diagram Example 301
- Making the 302
- When the 304
- Measurement is 304
- Complete 304
- • Amplitude 305
- • Measurement Methods 322
- Basic Noise 323
- Phase Noise 323
- Amplitude Noise Measurement 324
- AM Detector Considerations 326
- Procedure 329
- Disadvantages 333
- Method 2: Double-Sided Spur 334
- Method 3: Single-Sided-Spur 339
- AM Noise Measurement Examples 340
- Option 001 341
- L(f) graph) 361
- Looking For Obvious 361
- Problems 361
- Evaluating the Results 362
- Gathering More Data 365
- Outputting the Results 366
- Graph of Results 367
- • Marker,page15-9 367
- • Omit Spurs,page15-10 367
- Problem Solving 372
- 16 Advanced Software Features 378
- Phase Lock Loop Suppression 380
- Ignore Out Of Lock Mode 383
- Advanced Software Features 384
- PLL Suppression 385
- Information 385
- Supporting an 389
- Embedded VXI PC: 389
- Security Level 390
- 17 Error Messages and System 394
- Reference Graphs and Tables 395
- Port Signal Level 396
- L(f) graph to compute S 397
- Approaches UUT Noise 399
- AM Calibration 401
- See Caution 407
- Agilent/HP 8643A 408
- Mode Keys 408
- How to Access Special 409
- Functions 409
- Description of Special 409
- Functions 120 and 125 409
- Agilent/HP 8644B 410
- Function 120 411
- Agilent/HP 8664A 412
- Functions 120 413
- Agilent/HP 8665A 414
- Functions 120 and 124 415
- Agilent/HP 8665B 416
- 19 Connect Diagrams 418
- Connect Diagrams 419
- 20 System Specifications 444
- Specifications 445
- Phase Noise Customer Support 446
- Contacting Customer Support 448
- A Connector Care and 450
- • Dirty or damaged connectors 451
- RF Cable and 452
- Connector Care 452
- Proper Connector 452
- Connector Wear and 453
- SMA Connector 453
- Precautions 453
- Lint-Free cloths: 9310-4242 454
- Small foam swabs: 9300-1270 454
- Large foam swabs 9300-0468 454
- Product Part Number 454
- General Procedures 455
- Precision 2.4 mm and 457
- 3.5 mm Connectors 457
- Other Multipin 458
- Connectors 458
- MMS Module 460
- Removal and 460
- Reinstallation 460
- Touch-Up Paint 461
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