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Using the Oscilloscope

To make a measurement on a waveform

3-54

To make a measurement on a waveform

• Click and hold the mouse button or touch screen stylus on a measurement

icon, then drag the icon to the waveform event you want to measure then

release.

• Click on a measurement icon, then specify which source you want to measure

in the dialog box that is displayed.

For measurements on waveform features, such as those that involve waveform edges,

if you click the measurement icon and specify a source, the measurement defaults to

using the feature closest to the horizontal reference point. When you make the

measurement using drag-and-drop, the measurement uses the waveform feature

closest to the point where you drop the icon.

Only the most commonly used measurements are available on the toolbar. Others are

available by selecting them from the Measure menu. A few specialized measurements

are available only through the GPIB programming command set to the oscilloscope.

See the Programmer’s Reference.

When you drag and drop a measurement icon on a waveform, notice that the icon

outline changes color to match the color of each waveform it touches. This enables

you to easily see which waveform will be measured when you release. Also, the

measurement results are also displayed in color to make it easy to see which waveform

source is being measured.

For edge-sensitive measurements, when you drop the measurement icon on a

waveform, a geometric icon appears in the waveform marker color. This icon shows

exactly where the measurement is being made. The icon is also displayed next to the

measurement results readout to associate the readout with the waveform and feature

being measured. See figure 3-25. This feature helps you distinguish measurement

results from each other when you make multiple measurements on the same

waveform, but at different waveform features. For example, a series of rise time

measurements on several different edges of the same waveform all have unique

geometric icons to show each measurement’s location.

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Agilent Technologies Ininiium 9000 Guida Utente Pagina 90