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Software applications
86100D-200 enhanced jitter analysis
Option 200 provides extensive and accurate jitter decomposition,
which is increasingly important as data rates increase and
margins reduce. Quickly customize your view of many parameters
and take advantage of advanced features such as jitter spectrum
analysis.
86100D-201 advanced waveform analysis
Take advantage of powerful features in Option 201 to generate
much deeper waveform files, integrate MATLAB analysis, and
use the built-in linear feed-forward equalizer.
86100D-202 enhanced impedance and
S-parameter
Option 202 provides fast and easy characterization of return loss
and insertion loss for a wide range of devices and allows you to
see changes in your device as you make adjustments. Several
impedance parameters help you troubleshoot your designs to
optimize performance.
86100D-300 amplitude analysis/RIN/Q-factor
Extend the many capabilities from jitter mode into the amplitude
domain and see the decomposition of the amplitude into several
factors. Option 300 also reports relative intensity noise (RIN) and
Q-factor.
86100D-400 PLL and jitter spectrum
Option 400 quickly characterizes key parameters of phase-locked
loops and provides the jitter spectrum of your signal including
spread spectrum clocks. Control of the jitter source and receiver
is integrated to ensure fast results.
86100DU-401 advanced EYE analysis
For device testing with long patterns and to obtain BER-contour
mask testing, Option 401 integrates with the classic or FlexDCA
interfaces to decompose the jitter and amplitude interference
measurements into the key parameters. When using the
embedded capability within FlexDCA or the included automation
application, you may characterize jitter on simultaneous multiple
lanes and obtain concise and visual results.
86100D-SIM InfiniiSim-DCA
At higher data rates, the effect of measurement fixtures and
channels is prominent and can be accounted for through the
de-embedding capabilities within Option SIM. You may also view
measurements on live and simulated signals, allowing you to
compare design intent to actual performance.
N1012A OIF CEI compliance and debug
application
The N1012A application lets you fully characterize the ~120
transmitter test parameters (including 28G-VSR), reducing your
test time from hours to minutes. Included are return loss tests
and several utilities to improve your test productivity. Debug
mode enables you to characterize your devices well beyond the
parameters prescribed in the implementation agreements.
N1014A SFF-8431 compliance and debug
application
The N1014A application lets you fully characterize ~70 test
parameters including all transmitter tests for host, module and
host copper and all test signals for receiver testing. Return loss
tests and utilities are also included.
N1019A user-defined application
You may create your own test application or suite of tests using
the DCA-X and other instruments. Quickly and intuitively create
groups of tests, test descriptions, user prompts and test limits.
Use concise HTML reports to share your multiple test results with
your users.
N1081-4A IEEE802.3 Ethernet applications
The extensive requirements for IEEE802.3-2012 and 802.3bj are
fully covered in these four applications, which comprise ~400
tests. Characterize your device for one, four or ten lanes, and
analyze trends over time/temperature and between devices.
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