27
Option 500 productivity package
Option 500 enables Rapid Eye acquisition. Rapid Eye
achieves two significant benefits. First, unlike conventional
sampling and data display, when an eye mask test is
performed, every acquired sample will be compared to
the mask, as the central eye is composed of all acquired
samples. Effective throughput is improved at least 60%.
Second, incomplete eye diagram displays that can occur
when triggering at subrates are eliminated.
• Phase Locked Loop (PLL) measurements
PLL Bandwidth, PLL Peaking, Data Rate, Jitter Transfer
Function (JTF) Graph, Observed Jitter Transfer (OJTF) Graph,
JTF Model.
Option 401 advanced EYE analysis
• Jitter measurements
Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter (DJ),
J2 Jitter (J2), J5 Jitter (J5), J9 Jitter (J9), Data Dependent
Pulse Width Shrinkage (DDPWS)*
* Requires 86100D-200
• Amplitude measurements
Total Interference (TI), Random Noise (RN), Deterministic
Interference (DI), Eye Opening
• Mask test
Pass/Fail Status, BER limit
Option SIM InfiniiSim-DCA
2-port de-embedding and embedding; 4-port de-embedding
and embedding; add simulated random jitter and noise
TDR/TDT mode (requires TDR module)
• Quick TDR, TDR/TDT Setup,
Normalize, Response, Rise Time, Fall Time, Δ Time, Minimum
Impedance, Maximum Impedance, Average Impedance,
(Single-ended and Mixed-mode S-parameters with Option
202)
Additional capabilities
Standard functions
Standard functions are available through pull down menus
and soft keys, and some functions are also accessible
through the front panel knobs.
Markers
• Two vertical and two horizontal (user selectable)
TDR markers
• Horizontal — seconds or meter
• Vertical — Volts, Ohms or Percent Reflection
• Propagation — Dielectric Constant or Velocity
Limit tests
• Acquisition limits
• Limit Test “Run Until” Conditions — Off, # of
Waveforms, # of Samples
• Report Action on Completion — Save waveform to
memory, save screen image
• Measurement limit test
• Specify Number of Failures to Stop Limit Test
• When to Fail Selected Measurement — Inside Limits,
• Outside limits, always fail, never fail
• Report Action on Failure — Save waveform to memory,
save screen image, save summary
• Mask limit test
• Specify Number of Failed Mask Test Samples
• Report Action on Failure — Save waveform to memory,
save screen image, save summary
Configure measurements
• Thresholds
10%, 50%, 90% or 20%, 50%, 80% or Custom
• Eye Boundaries
• Define boundaries for eye measurments
• Define boundaries for alignment
• Format Units for
• Duty Cycle Distortion — Time or Percentage
• Extinction/Contrast Ratio — Ratio, Decibel or
Percentage
• Eye Height — Amplitude or Decibel (dB)
• Eye Width — Time or Ratio
• Average Power — Watts or Decibels (dBm)
• Top base definition
Automatic or Custom
• Δ time definition
• First Edge Number, Edge Direction, Threshold
• Second Edge Number, Edge Direction, Threshold
• Jitter mode
• Units (time or unit interval, watts, volts, or unit
amplitude)
• Signal type (data or clock)
• Measure based on edges (all, rising only, falling only)
• Graph layout (single, split, quad)
Measurements
(12 pagine)
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