Agilent Technologies B2902 Manuale di Servizio Pagina 86

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2- 46 Agilent B2900 SCPI Command Reference, Edition 2
Subsystem Command Summary
Reading Source/Measure Data
:CALC[c]:LIM[m]:COMP:DIG[:DATA]
pattern
:CALC[c]:LIM[m]:COMP:DIG[:DATA]?
Defines the bit pattern used to indicate a
failure of the compliance status check
specified by m.
pattern=0 to 16383
0
:CALC[c]:LIM[m]:COMP:FAIL criter
ia
:CALC[c]:LIM[m]:COMP:FAIL?
Sets the judgement criteria for the
compliance status check specified by m.
criteria=IN determines that the limit test
has failed if the channel goes into the
compliance state.
criteria=OUT determines that the limit
test has failed if the channel comes out of
the compliance state.
IN
:CALC[c]:LIM[m]:FAIL?
Returns the result of the limit test
specified by m. 0: Passed, 1: Failed.
:CALC[c]:LIM[m]:FUNC type
:CALC[c]:LIM[m]:FUNC?
Sets the type of the limit test specified by
m.
type=COMP sets the compliance status
check which checks if the channel is in
the compliance status.
type=LIM sets the limit test which checks
if the measurement value is between the
upper limit and the lower limit.
LIM
:CALC[c]:LIM[m]:LOW limit
:CALC[c]:LIM[m]:LOW? [MINimum|MA
Ximum|DEFault]
Sets a lower limit used for the limit test
specified by m.
limit=MINimum|MAXimum|DEFault|
-9.999999E+20 to +9.999999E+20
-1
:CALC[c]:LIM[m]:LOW:DIG[:DATA] p
attern
:CALC[c]:LIM[m]:LOW:DIG[:DATA]?
Defines the bit pattern used to indicate
failed-by-exceeding-lower-limit of the
limit test specified by m. The bit pattern is
used for the GRAD composite limit test.
pattern=0 to 16383
0
Command Summary Reset setting
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